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XRF 940 XY

• - Measuring head for direct integration into a XY-positioning
•   unit in air
• - Custom-designed configuration in order to guarantee the
•   optimal measurement result
• - Displacement axis of up to 2000 mm or 1000 mm for the
•   measuring head
• - Measuring of coating profiles with optional coordinates
• - Measuring pulse: 1s (minimum)
• - Reproducibility of measurement results: 1%, (depending
•   on measurement duration)
• - Temperature of measurement objects: up to 80°C
• - Compact water-cooled X-ray source
• - Silicon drift chamber detector for high energy resolution
•   at high pulse rates
• - Direct transfer of measurement results and status signals
•   to process control system
• - Measuring system controlled by process control system